Enhanced backscatter from monodisperse contaminants on a substrate.

Computer Science

Scientific paper

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Scattering: Surfaces, Surfaces: Reflection Effect

Scientific paper

Enhanced backscatter has been used to characterize rough, irregular substrates and polydispersions of contaminants on a substrate. For monodisperse contaminants, the enhanced backscatter peak can be obscured by the structure of the total intensity signal. Averaging backscatter intensities from a substrate contaminated by monodisperse contaminants when the system is illuminated by plane waves of different incident angles removes the structure of the individual intensity signals, isolating the backscatter peak. The resulting peak contains information which can be used to characterize the contaminants. The authors demonstrate this technique by modeling the size and shape of this peak for monodisperse spherical contaminants on a substrate and comparing these results with experimental measurements.

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