Elemental Composition Analyses in Thick Atmosphere Using the Atmopsheric Electron-induced X-Ray Spectrometer (AEXS) Instrument

Details Elemental Composition Analyses in Thick Atmosphere Using the Atmopsheric Electron-induced X-Ray Spectrometer (AEXS) Instrument Elemental Composition Analyses in Thick Atmosphere Using the Atmopsheric Electron-induced X-Ray Spectrometer (AEXS) Instrument

Mar 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006lpi....37.2178u&link_type=abstract

37th Annual Lunar and Planetary Science Conference, March 13-17, 2006, League City, Texas, abstract no.2178

Computer Science

Scientific paper

The results of the analyses of the XRF spectra excited by using the
recently assembled stand-alone AEXS microprobe to determine surface
elemental composition of NIST and USGS metal and mineral standards in
ambient atmosphere pressure is described.

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