Electron micrography and X-ray study of dip-lacquered LiF (220)

Details Electron micrography and X-ray study of dip-lacquered LiF (220) Electron micrography and X-ray study of dip-lacquered LiF (220)

Sep 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991apopt..30.3667p&link_type=abstract

Applied Optics (ISSN 0003-6935), vol. 30, Sept. 1, 1991, p. 3667-3672.

Astronomy and Astrophysics

Astronomy

1

Crystal Surfaces, Electron Microscopy, Gold Coatings, Lithium Fluorides, Surface Roughness, X Ray Spectroscopy, Dipping, Microstructure, Mirrors, Optical Properties, Substrates, X Ray Astronomy

Scientific paper

It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in X-ray astronomy. It is demonstrated that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and X-ray reflection, 10-A rms roughness of Au-coated dip-lacquered LiF(220) crystals has been measured, as opposed to 60 A measured on the bare LiF(220) crystal surface.

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