Mathematics – Logic
Scientific paper
Jul 2000
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000came.work..112f&link_type=abstract
Concepts and Approaches for Mars Exploration, p. 112
Mathematics
Logic
Mars Atmosphere, Mars Surface, Electrical Measurement, Meteorological Parameters, Instrument Packages, Dust Storms, Electrostatic Charge
Scientific paper
In 1999, the NASA/Human Exploration and Development of Space (HEDS) enterprise selected a number of payloads to fly to the Martian surface in an 03 opportunity (prior to the MPL loss). Part of a proposed experiment, ECHOS, was selected to specifically understand the electrical charging hazards from tribocharged dust in the ambient atmosphere, in dust devils, and in larger storms. It is expected that Martian dust storms become tribocharged much like terrestrial dust devils which can possess almost a million elementary charges per cubic centimeter. The ECHOS package features a set of instruments for measuring electric effects: a radio to detect AC electric fields radiating from discharges in the storm,a DC electric field system for sensing electrostatic fields from concentrations of charged dust grains, and a lander electrometer chain for determining the induced potential on its body and MAV (Mars Ascent Vehicle) during the passages of a charged dust storm. Given that electricity is a systemic process originating from wind-blown dust, we also proposed to correlate the electrical measurements with fundamental fluid/meteorological observations, including wind velocity and vorticity, temperature, and pressure. Triboelectricity will also affect local chemistry, and chemical-sensing devices were also considered a feature of the package. The primary HEDS objectives of the ECHOS sensing suite is to discover and monitor the natural electrical hazards associated with dust devils and storms, and determine their enviro-effectiveness on human systems. However, ECHOS also has a strong footprint in the overarching science objectives of the Mars Surveyor Program.
Delory Gregory T.
Desch Michael D.
Farrell William M.
Haberle Robert M.
Hillard Barry G.
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