Computer Science
Scientific paper
Sep 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003esasp.540..367d&link_type=abstract
In: Proceedings of the 9th International Symposium on Materials in a Space Environment, 16-20 June 2003, Noordwijk, The Netherla
Computer Science
Space Environment, Materials, Ground Testing
Scientific paper
This paper describes testing to investigate the effects of vacuum ultraviolet (VUV) radiation on Teflon® fluorinated ethylene propylene (FEP) film, examining differences in mechanical properties degradation for samples of 50.8 μm thickness exposed to VUV of various lower cut-off wavelengths. Samples were exposed in a high vacuum facility to VUV lamps, which produce radiation in the 115-400 nm wavelength range, but with the highest intensity produced below 200 nm. Windows of fused silica, crystalline quartz, and magnesium fluoride provided lower cut-off wavelengths of 155, 140, and 115 nm, respectively. Lamp intensity was measured in the 115-200 nm wavelength range throughout the sample exposures, and these data were used to estimate intensity and incident energy in various wavelength ranges, between 115 and 400 nm. Samples were analyzed for tensile strength and elongation at failure. The effects of the different wavelength ranges were compared and discussed in terms of the expected depth to which various wavelengths are deposited into FEP.
Dever Joyce A.
McCracken Cara A.
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