Computer Science – Performance
Scientific paper
Sep 2005
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5869..337n&link_type=abstract
Optical Manufacturing and Testing VI. Edited by Stahl, H. Philip. Proceedings of the SPIE, Volume 5869, pp. 337-345 (2005).
Computer Science
Performance
3
Scientific paper
The technique for measuring changes in diffuse surfaces using Electronic Speckle Pattern Interferometry (ESPI) is well known. We present a new electronic speckle pattern interferometer that takes advantage of a single-frame spatial phase-shifting technique to significantly reduce sensitivity to vibration and enable complete data acquisition in a single laser pulse. The interferometer was specifically designed to measure the stability of the James Webb Space Telescope (JWST) backplane. During each measurement the laser is pulsed once and four phase-shifted interferograms are captured in a single image. The signal is integrated over the 9ns pulse which is over six orders of magnitude shorter than the acquisition time for conventional interferometers. Consequently, the measurements do not suffer from the fringe contrast reduction and measurement errors that plague temporal phase-shifting interferometers in the presence of vibration. This paper will discuss the basic operating principle of the interferometer, analyze its performance and show some interesting measurements.
Brock Neal
Hayes Jeffrey
Millerd James
North Morris Michael
Saif Babak
No associations
LandOfFree
Dynamic phase-shifting electronic speckle pattern interferometer does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Dynamic phase-shifting electronic speckle pattern interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic phase-shifting electronic speckle pattern interferometer will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-1222968