Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics

Details Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics Diffraction-limited astronomical X-ray imaging and X-ray interferometry using normal-incidence multilayer optics

Mar 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4851..441w&link_type=abstract

X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy. Edited by Joachim E. Truemper, Harvey D. Tananbaum. Proceedings

Astronomy and Astrophysics

Astronomy

Scientific paper

We describe a new technical approach for observations of Galactic and extra-Galactic soft X-ray sources with ultra-high angular resolution. The technique is based on the use of recently developed diffraction-limited, normal-incidence mirror substrates and ultra-short-period multilayer coatings, tuned to specific bright emission lines in the range 16 < l < 40 Å, for the construction of a diffraction-limited X-ray telescope. Sub-milliarcsecond resolution could be achieved in a moderately-sized Cassegrain or prime-focus geometry, while resolution of order 0.01 microarcseconds could be achieved using a synthetic aperture X-ray interferometer constructed from an array of such telescopes spread over a 50 km baseline. We describe our technical approach in detail and outline some of the observations that would become possible with the proposed instrumentation.

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