Development of high-precision laser heterodyne metrology gauges

Details Development of high-precision laser heterodyne metrology gauges Development of high-precision laser heterodyne metrology gauges

Feb 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5634..247z&link_type=abstract

Advanced Sensor Systems and Applications II. Edited by Rao, Yun-Jiang; Kwon, Osuk Y.; Peng, Gang-Ding. Proceedings of the SPIE,

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Laser interferometers with better than10 picometer (pm) accuracy in displacement measurement and 1-3 microns in absolute distance ranging accuracy are sought in several of NASA's planned missions, such as the Space Interferometry Mission (SIM) and Terrestrial Planet Finder (TPF). Over the past several years, we have made significant progress at JPL toward a laser heterodyne interferometer system that can provide both picometer displacement measurement and micron level absolute distance measurement. This paper presents an review on the development of high precision metrology gauges for these missions.

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