Computer Science
Scientific paper
Nov 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2283...96d&link_type=abstract
Proc. SPIE Vol. 2283, p. 96-106, X-Ray and Ultraviolet Spectroscopy and Polarimetry, Silvano Fineschi; Ed.
Computer Science
Scientific paper
A prototype array consisting of eight diffraction gratings has been fabricated for the XMM Reflection Grating Spectrometer. A component of the full spectrometer is an array of approximately 200 diffraction gratings. The diffraction gratings were produced using lightweight silicon carbide substrates and a replication technique. The prototype array was developed and assembled using the same tolerances as the flight arrays which have typical tolerances of 3 micrometers in translation and sub-arc seconds in rotation. The metrology applied during inspection and assembly included precision linear measurements, full aperture figure measurements, and angular interferometry.
Bixler Jay V.
Decker Todd A.
Hailey Charles J.
Kahn Steven M.
Montesanti Richard C.
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