Detection and Measurement of Poorly Sampled Point Sources Imaged With 2-D Array

Astronomy and Astrophysics – Astronomy

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

10

Instrumentation: Cameras, Methods: Observational

Scientific paper

Imaging systems in which the pixels are large compared to the point spread function produce undersampled data for which traditional 2-D Gaussian PSF fitting will not work well. Such systems include wide-field imaging applications (CCD mosaics) and space-based telescopes. The current astronomical literature provides few recipes to use when dealing with undersampled data. We present a method of providing optimum signal-to-noise data matching for poorly sampled point sources which makes use of profile fitting but only within small, variable-size pixel masks. A wide-field imaging Schmidt telescope project, Lowell Observatory Near-Earth Object Search (LONEOS), is discussed as an example. Our pixel mask technique is applied to model images from the LONEOS camera, and we show that we can determine point-source centroids and brightnesses with good precision, even for faint objects.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Detection and Measurement of Poorly Sampled Point Sources Imaged With 2-D Array does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Detection and Measurement of Poorly Sampled Point Sources Imaged With 2-D Array, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detection and Measurement of Poorly Sampled Point Sources Imaged With 2-D Array will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1457610

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.