Detection and cleaning of flux residue inside connectors

Details Detection and cleaning of flux residue inside connectors Detection and cleaning of flux residue inside connectors

Sep 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003esasp.540..521p&link_type=abstract

In: Proceedings of the 9th International Symposium on Materials in a Space Environment, 16-20 June 2003, Noordwijk, The Netherla

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Space Environment, Materials

Scientific paper

At the CNES French Space Agency we were asked to analyse failed video connectors used on spacecraft. In order to identify the root cause of the defect we had to develop a detection methodology based on U.V fluorescence. This technique revealed flux migration inside connectors. In a second step, we extended our technique to cleaning methodology. The connectors cleaning process covered each of the following steps: chemical product choice (more than ten were tested): efficiency, material compatibility - ultrasonic cleaning methodology: frequencies, bath configurations - drying steps eg vacuum, with hot air. Finally the cleaning method was fully qualified for use in space projects. We obtained excellent results on old soldering flux residues (a few years) generally considered as impossible to clean (1). We believed that this technique will be used for inspection and cleaning of flux in a wide area.

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