Deriving Venus Surface Properties from Backscatter and Emission Data

Details Deriving Venus Surface Properties from Backscatter and Emission Data Deriving Venus Surface Properties from Backscatter and Emission Data

Mar 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996lpi....27..193c&link_type=abstract

Lunar and Planetary Science, volume 27, page 193

Mathematics

Logic

Remote Sensing, Venus

Scientific paper

Variations in roughness and dielectric constant on Venus form the primary basis for characterizing surface geologic units. Radar backscatter and radiothermal emission measurements used together are capable of discriminating changes in these parameters, but the results are highly dependent upon the physical models used. One method for refining these models is to study areas for which we have data at multiple viewing angles or polarizations. The work presented here illustrates a number of data combinations for small areas which may help to constrain models used on a planet-wide basis.

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