Demonstration of nanometer-level active metrology for long-range interferometric displacement measurements

Details Demonstration of nanometer-level active metrology for long-range interferometric displacement measurements Demonstration of nanometer-level active metrology for long-range interferometric displacement measurements

Jul 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4006..838j&link_type=abstract

Proc. SPIE Vol. 4006, p. 838-846, Interferometry in Optical Astronomy, Pierre J. Lena; Andreas Quirrenbach; Eds.

Astronomy and Astrophysics

Astronomy

Scientific paper

We report on the laboratory demonstration of an active linear metrology scheme using two separate lasers. In `active' metrology, the passive retroreflector in one arm of a typical heterodyne interferometer is replaced with an active optical transponder. The Transponder can dramatically boost the returned signal strength, thereby providing a way to perform metrology and pathlength control over long (> km) distances. Two Lightwave Electronics non-planar ring oscillator lasers at a wavelength of 1.319 micrometers were used as the Source and Transponder. The frequency of the Transponder is offset locked to the signal received from the Source using the Lightwave Laser Offset Locking Accessory, and the Transponder beam is sent back to the Source. The phases of the beat signals are measured locally at the Source and Transponder by appropriately demodulating the signal, and post-processed to determine displacement. In initial experiments, the standard deviation of the measurement errors was less than three nanometers.

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