Computer Science
Scientific paper
Sep 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003esasp.540..655t&link_type=abstract
In: Proceedings of the 9th International Symposium on Materials in a Space Environment, 16-20 June 2003, Noordwijk, The Netherla
Computer Science
Space Environment, Materials
Scientific paper
Influences of ion bombardment on chemical structures and negative charging/discharging characteristics of spacecraft polymer films were examined. Furthermore, arcing characteristics of negatively-biased anodized aluminum sample (AAS) plates in plasma environment were investigated. Polyimide Upilex-S and Teflon FEP films were exposed to oxygen and nitrogen ion beams. The in-situ x-ray photoelectron spectroscopy and quadrupole mass spectrometer analyses showed that an addition reaction and a desorption of structural components occurred by ion bombardment. After degradation of film surfaces by ion bombardment, negative charging experiment was carried out by electron beam exposure. The characteristic of the charging current by exposure of electron beams to polymer films showed a periodical time variation with a slow decay after a peak. The variation corresponded to a cyclic phenomenon of negative charging and discharging on the film surfaces. The cyclic period increased with dose of nitrogen ions had attacked. Degradation of polymer films by ion bombardment was considered to influence their charging/discharging phenomenon. The arcing characteristics for AAS in plasma environment showed that both the peak arc current and the total charge emitted by arcing increased with initial charging voltage and neutral particle number density. The diameter of arc spots increased with initial charging voltage although it was almost constant regardless of neutral particle density. Accordingly, high voltage operation of LEO spacecraft might bring degradation of AAS by arcing.
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