Degradation modeling applied to residual lifetime prediction using functional data analysis

Details Degradation modeling applied to residual lifetime prediction using functional data analysis Degradation modeling applied to residual lifetime prediction using functional data analysis

2011-07-28

arxiv.org/abs/1107.5712v1

Annals of Applied Statistics 2011, Vol. 5, No. 2B, 1586-1610

Statistics

Applications

Published in at http://dx.doi.org/10.1214/10-AOAS448 the Annals of Applied Statistics (http://www.imstat.org/aoas/) by the Ins

Scientific paper

10.1214/10-AOAS448

Sensor-based degradation signals measure the accumulation of damage of an engineering system using sensor technology. Degradation signals can be used to estimate, for example, the distribution of the remaining life of partially degraded systems and/or their components. In this paper we present a nonparametric degradation modeling framework for making inference on the evolution of degradation signals that are observed sparsely or over short intervals of times. Furthermore, an empirical Bayes approach is used to update the stochastic parameters of the degradation model in real-time using training degradation signals for online monitoring of components operating in the field. The primary application of this Bayesian framework is updating the residual lifetime up to a degradation threshold of partially degraded components. We validate our degradation modeling approach using a real-world crack growth data set as well as a case study of simulated degradation signals.

Affiliated with

Also associated with

No associations

Rating

Degradation modeling applied to residual lifetime prediction using functional data analysis does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Degradation modeling applied to residual lifetime prediction using functional data analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Degradation modeling applied to residual lifetime prediction using functional data analysis will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-414223