Statistics – Applications
Scientific paper
Feb 2002
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002spie.4493...88d&link_type=abstract
Proc. SPIE Vol. 4493, p. 88-99, High-Resolution Wavefront Control: Methods, Devices, and Applications III, John D. Gonglewski; M
Statistics
Applications
Scientific paper
We report on an integrated Hartmann wavefront sensor (WFS) using passive-pixel architecture and pixels clustered as position-sensitive detectors for dynamic wavefront analysis. This approach substitutes a conventional imager, such as a CCD or CMOS imager, by a customized detector, thus improving the overall speed performance. CMOS (complementary-metal- oxide-semiconductor) technology enables on-chip integration of several analog and digital circuitry. The sensor performance depends on the feature size of the technology, noise levels, photosensitive elements employed, architecture chosen and reconstruction algorithm.
de Lima Monteiro Davies W.
Iordanov Ventzeslav P.
Loktev Mikhail Y.
Rocha J. G.
Sarro Pasqualina M.
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