Computer Science
Scientific paper
Apr 1985
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985aero.rept.....k&link_type=abstract
Final Report, Jan. - Nov. 1984 Aerospace Corp., Los Angeles, CA. Space Sciences Lab.
Computer Science
Latch-Up, Linear Energy Transfer (Let), Random Access Memory, Single Event Upsets, Microprocessors, Radiation Damage, Spacecraft Electronic Equipment, Very Large Scale Integration
Scientific paper
Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of interest to NASA space programs. In cases where a threshold linear energy transfer (LET) for SEU could be measured, an upset rate in a low inclination Space Shuttle orbit was computed. The predicted upset rates are extremely low, except for the devices with LET thresholds below the geomagnetic cutoff for altitude and inclination of the Space Shuttle orbit. While some of the devices do exhibit latchup, the cross sections and threshold LETs are such that the risk associated with flying these devices in low, near equatorial orbits is small if not negligible.
Imamoto S. I.
King C. G.
Koga Ryan
Kolasinski W. A.
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