Correlation between electron and proton induced permanent degradation in a COTS optocoupler

Details Correlation between electron and proton induced permanent degradation in a COTS optocoupler Correlation between electron and proton induced permanent degradation in a COTS optocoupler

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507..261g&link_type=abstract

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

Computer Science

Scientific paper

We have studied the effect of proton and electron irradiation with energies from 6 MeV to 200 MeV on commercial optocouplers. The basic degradation mechanisms for such devices are reviewed. Electrons and protons induce both Total Ionising Dose and Displacement Damage. The total Current Transfer Ratio (CTR) degradation is studied to prove that the degradation of the LED is the most important. Using the concept of displacement damage dose, we propose a new approach to predict optocoupler degradation for a space mission.

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