Comparison of the Swift BAT Hard X-ray Survey AGN with Optical and X-ray AGN Surveys

Details Comparison of the Swift BAT Hard X-ray Survey AGN with Optical and X-ray AGN Surveys Comparison of the Swift BAT Hard X-ray Survey AGN with Optical and X-ray AGN Surveys

Dec 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005aas...207.3802t&link_type=abstract

American Astronomical Society Meeting 207, #38.02; Bulletin of the American Astronomical Society, Vol. 37, p.1222

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Scientific paper

The Swift BAT hard x-ray (14-200 keV) survey is the first complete catalog of hard x-ray detected AGN. At 9.5 months, the survey is compete (90% of the sky) to a sensitivity of <2 milliCrab. The observed time dependence of the sensitivity (t1/2) extends to exposures >2 × 106 s and we expect this time dependence to continue at longer exposures. At these energies, NH > ˜ 1024 is required to significantly reduce the BAT flux. We have a high confidence in our identifications. The expectation value of a false detection on the whole sky is <1 (bootstrapped from local image variances). The Swift XRT telescope is used to identify BAT survey sources that cannot be identified from catalog searches and to directly measure NH for sources without x-ray previous spectra. We will present x-ray measurements for some of the AGN identified by Swift. The distribution of NH for Swift BAT will be presented by Markwardt et al in this conference. We will present the distributions of Lopt}/L{BAT and Lx}/L{BAT for the BAT detected AGN. This is a critical test of the completeness of AGN surveys at other wavelengths. These surveys are the basis for understanding the evolution of AGN and the origin of the cosmic x-ray background.

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