Combining Optical and Infrared Secondary Eclipse Measurements Obtained with Epoxi, Spitzer and Kepler.

Astronomy and Astrophysics – Astronomy

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Scientific paper

The measurement of secondary eclipses of extrasolar planets is one of the most accessible observational tools at our disposal for characterizing the atmospheres of these planets. By measuring the relative depths of the secondary eclipse in multiple bandpasses, one can reconstruct a low-resolution emission spectrum from the dayside of the planet. Here we present secondary eclipse constraints for a set of transiting planet targets observed at optical wavelengths with the NASA EPOXI Mission of Opportunity. Where possible we combine these results with additional photometry from Kepler and Spitzer, which further constrain the total planetary emission, and present atmospheric models for the daysides of the planets that are consistent with both the optical and infrared measurements.

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