Cleaning Genesis Samples with Gas Cluster Ion Beams: Method Evaluation by Comparative Studies with RIMS, GI-XRF and Other Surface Characterization Techniques

Details Cleaning Genesis Samples with Gas Cluster Ion Beams: Method Evaluation by Comparative Studies with RIMS, GI-XRF and Other Surface Characterization Techniques Cleaning Genesis Samples with Gas Cluster Ion Beams: Method Evaluation by Comparative Studies with RIMS, GI-XRF and Other Surface Characterization Techniques

Mar 2012

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2012lpi....43.2732v&link_type=abstract

43rd Lunar and Planetary Science Conference, held March 19–23, 2012 at The Woodlands, Texas. LPI Contribution No. 1659, id.2732

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Scientific paper

We conducted concerted and all-rounded evaluation of the efficiency of
Gas Cluster Ion Beam technology applied to cleaning of contaminated
surfaces of Genesis Solar Wind samples. We compared results obtained
with RIMS, GI-XRF and other techniques.

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