Charge Transfer Efficiency of the STIS CCD:The time dependence of charge loss and centroid shiftsfrom Internal Sparse Field data

Details Charge Transfer Efficiency of the STIS CCD:The time dependence of charge loss and centroid shiftsfrom Internal Sparse Field data Charge Transfer Efficiency of the STIS CCD:The time dependence of charge loss and centroid shiftsfrom Internal Sparse Field data

Feb 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006stis.rept....1g&link_type=abstract

Instrument Science Report STIS 2006-01, 11 pages

Astronomy and Astrophysics

Astronomy

Hubble Space Telescope, Hst, Space Telescope Science Institute, Stis, Internal Sparse Field Test, Charge Transfer Efficiency, Cte

Scientific paper

We describe the Internal Sparse Field test used to characterize relevant aspects of the decreasing Charge TransferEf ciency (CTE) of the STIS CCD with elapsed on-orbit time. We measure two main observational effectsof CTE: Fractional signal loss and centroid shift, using arti cial point-source spectra read out by ampli ersat both serial registers. We derive time constants of the increases of fractional signal loss (21.8% yr-1) and centroid shift (16.0% yr-1) due to CTE effects, and a very tight relation between the two. This relationshould be useful for science programs requiring sub-pixel astrometric accuracy. Finally, we compare results inthe two supported gain settings of the STIS CCD (gain=1 and gain= 4).

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