Characterization of polycrystalline phosphors for area x-ray detectors

Details Characterization of polycrystalline phosphors for area x-ray detectors Characterization of polycrystalline phosphors for area x-ray detectors

Dec 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.2009...98g&link_type=abstract

Proc. SPIE Vol. 2009, p. 98-108, X-Ray Detector Physics and Applications II, Victor J. Orphan; Ed.

Statistics

Applications

7

Scientific paper

Incorporation of polycrystalline phosphor screens into efficient, high precision x-ray detectors requires an understanding of the subtleties of x-ray capture and subsequent light transmission in the screen, as well as an awareness of how phosphors affect detector calibration. We discuss the preparation of such phosphor screens and their characterization with respect to efficiency, stopping power, spatial resolution, decay time, and spectral output.

Affiliated with

Also associated with

No associations

Rating

Characterization of polycrystalline phosphors for area x-ray detectors does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Characterization of polycrystalline phosphors for area x-ray detectors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Characterization of polycrystalline phosphors for area x-ray detectors will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1302524