Characterization of NbSi films for TES bolometers

Astronomy and Astrophysics – Astronomy

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Scientific paper

Future space experiments will require large arrays of sensitive detectors in the submillimeter and millimeter range. Superconducting transition-edge sensors (TESs) are currently under heavy development to be used as ultra sensitive bolometers. In addition to good performance, the choice of material depends on long term stability (both physical and chemical) along with a good reproducibility and uniformity in fabrication. For this purpose we are investigating the properties of co-evaporated NbSi thin films. NbSi is a well-known alloy for use in resistive thermometers. We present a full low temperature characterization of superconductive NbSi films. In order to tune the critical temperature of the NbSi thermometers down to the desired range, we have to adjust the concentration of niobium in the NbSi alloy. Tests are made using 4He-cooled cryostats, 300mK 3He mini-fridges, Resistance Bridges and commercial SQUID. Measured parameters are the critical temperature, the sharpness of the transition. Noise measurements are on-going.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Characterization of NbSi films for TES bolometers does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Characterization of NbSi films for TES bolometers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Characterization of NbSi films for TES bolometers will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1061761

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.