Characterication and Testing of Dark Energy Survey CCDs

Details Characterication and Testing of Dark Energy Survey CCDs Characterication and Testing of Dark Energy Survey CCDs

Dec 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006aas...209.2204d&link_type=abstract

2007 AAS/AAPT Joint Meeting, American Astronomical Society Meeting 209, #22.04; Bulletin of the American Astronomical Society, V

Astronomy and Astrophysics

Astronomy

Scientific paper

The Dark Energy Survey focal plane will have 62 2k x 4k imaging CCDs. The CCDs are back-illuminated, fully-depleted 250 micron thick devices developed at Lawrence Berkeley National Laboratory. We describe the packaging procedure, the infrastructure we have developed for characterization and testing of CCDs, including flatness, dark current, read noise, linearity and gain, quantum efficiency vs. wavelength from 400 to 1000 nm, charge transfer inefficiency, persistance, and diffusion length. We provide the initial results, including tests in a full-scale prototype camera vessel.

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