Champlane X-ray Analysis

Details Champlane X-ray Analysis Champlane X-ray Analysis

Jun 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006aas...208.4807h&link_type=abstract

American Astronomical Society Meeting 208, #48.07; Bulletin of the American Astronomical Society, Vol. 38, p.124

Astronomy and Astrophysics

Astronomy

Scientific paper

We summarize the X-ray analysis results of the Chandra Multiwavelength Plane survey (ChaMPlane), which is to constrain low luminosity accretion source content in the Galaxy using the Chandra archival data and optical and IR follow-up observations. From the Chandra archival data (A01-A06), we have detected more than 12000 point sources over 105 distinct fields (156 observations) covering 8 deg^2 in the Galactic Plane. The source catalog and X-ray results are available through our project website (http://hea-www.cfa.harvard.edu/ChaMPlane/). We highlight some of X-ray analysis findings and outline the future plan. For many X-ray sources with no reliable counterpart from optical or IR observations, X-ray driven source properties are the only hint to the nature of the sources. Therefore, we introduce a quantile-based technique to drive extinction and spectral parameters of each source, which allows to estimate the flux and distance of the source.

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