ChaMPlane Source Optical Identification and Classification

Details ChaMPlane Source Optical Identification and Classification ChaMPlane Source Optical Identification and Classification

Dec 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007aas...21113205z&link_type=abstract

American Astronomical Society, AAS Meeting #211, #132.05; Bulletin of the American Astronomical Society, Vol. 39, p.962

Astronomy and Astrophysics

Astronomy

Scientific paper

ChaMPlane is designed to survey the point X-ray sources discovered by the Chandra X-ray Observatory in the galactic plane in order to constrain the X-ray binary population in the Galaxy. ChaMPlane includes the data from the Chandra achieve as well as our own Bulge Latitude Survey and Deep Windows observations and optical photometry/spectroscopy observations. We have observed 66 ChaMPlane fields which cover about 23 square degrees and 222 ACIS observations in the galactic plane during the Chandra Cycles 1-8. Over 15000 point X-ray sources are detected within the survey fields. Their counterparts are searched in the deep optical photometry in V, I, R, H-alpha and IR photometry in the bulge region in J, H, K. In low extinction fields, more than half of the X-ray sources have optical counterparts. In high extinction fields, more than 90 percent of the soft X-ray sources have optical counterparts. More than 5000 spectra have been taken for the identified counterparts for classification. We present our source identifications and overall survey coverage in ChaMPlane to date. The public database is available online at: http://hea-www.harvard.edu/ChaMPlane/

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