ChaMP X-ray point source catalog (Kim+, 2007)

Details ChaMP X-ray point source catalog (Kim+, 2007) ChaMP X-ray point source catalog (Kim+, 2007)

Jan 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009ycat..21690401k&link_type=abstract

VizieR On-line Data Catalog: J/ApJS/169/401. Originally published in: 2007ApJS..169..401K

Mathematics

Probability

Surveys, X-Ray Sources

Scientific paper

We present the Chandra Multiwavelength Project (ChaMP) X-ray point source catalog with ~6800 X-ray sources detected in 149 Chandra observations covering ~10deg2. The full ChaMP catalog sample is 7 times larger than the initial published ChaMP catalog. The exposure time of the fields in our sample ranges from 0.9 to 124ks, corresponding to a deepest X-ray flux limit of f0.5-8.0=9x10-16ergs/cm2/s. The ChaMP X-ray data have been uniformly reduced and analyzed with ChaMP-specific pipelines and then carefully validated by visual inspection. The ChaMP catalog includes X-ray photometric data in eight different energy bands as well as X-ray spectral hardness ratios and colors. To best utilize the ChaMP catalog, we also present the source reliability, detection probability, and positional uncertainty.
(10 data files).

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