CCD's on high resistivity bulk silicon for x ray spectroscopy on XMM

Details CCD's on high resistivity bulk silicon for x ray spectroscopy on XMM CCD's on high resistivity bulk silicon for x ray spectroscopy on XMM

Dec 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992esasp.356..321h&link_type=abstract

In ESA, Proceedings of an ESA Symposium on Photon Detectors for Space Instrumentation p 321-324 (SEE N94-15025 03-19)

Astronomy and Astrophysics

Astronomy

Charge Coupled Devices, Imaging Spectrometers, Silicon, Spacecraft Instruments, X Ray Spectroscopy, Electrical Resistivity, Requirements, X Ray Astronomy

Scientific paper

CCD's (Charge Coupled Devices) were chosen as the X-ray imaging spectrometers on ESA's cornerstone mission XMM (X-ray astronomy Multi Mirror). The CCD's being developed for the nondispersive imaging spectrometer (EPIC), operating in the 0.1 to 15 keV band and which require high quantum efficiency with Fano limited energy resolution are described. The CCD's are manufactured on bulk silicon with resistivity greater than 8000 Omega cm. This produces a depletion depth approaching 90 micrometers which yields good X-ray spectroscopy with high efficiency (90 percent at 6.4 keV). The developments described are sufficient to satisfy the high energy requirements of the EPIC imaging spectrometer.

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