Calibration Of [O IV] 26 Micron As A Measure Of Intrinsic AGN Luminosity

Astronomy and Astrophysics – Astronomy

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

1

Scientific paper

We follow up on the demonstration of a correlation between the [O IV] 25.89 micron line luminosity and the very hard X-ray luminosity (14--195 keV) in active galactic nuclei (AGN) (Melendez et al. 2008). For the volume--limited Revised Shapley Ames Seyfert sample, we compare [O IV] line luminosities from Spitzer with hard (E>10; keV) X-ray luminosities from Swift, BeppoSAX, and Integral. We use the bolometrically--corrected hard X-ray luminosities for Seyfert 1 AGN to calibrate the [O IV] luminosity as a measure of intrinsic AGN luminosity. This calibration will be useful for high-obscuration cases like ULIRGs and Compton-thick AGN. We find that Seyfert 2s have an average L[O IV]/L(hard X-ray) ratio three times lower than that measured for Seyfert 1 AGN. The ratio for Compton-thick AGN is nine times lower. Interpreting these decrements as caused by X-ray absorption, we infer obscuring column densities for Seyfert 2 and Compton-thick AGN.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Calibration Of [O IV] 26 Micron As A Measure Of Intrinsic AGN Luminosity does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Calibration Of [O IV] 26 Micron As A Measure Of Intrinsic AGN Luminosity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Calibration Of [O IV] 26 Micron As A Measure Of Intrinsic AGN Luminosity will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1700979

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.