Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility

Details Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility

Sep 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2518..438f&link_type=abstract

Proc. SPIE Vol. 2518, p. 438-456, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, Oswald H. Siegmund; John V. Valler

Astronomy and Astrophysics

Astronomy

1

Scientific paper

The high energy transmission grating spectrometer (HETGS) of the Advanced X-Ray Astrophysics Facility (AXAF) will include 336 gratings, of period 2000 angstrom and 4000 angstrom. The flight gratings have entered production, and preliminary tests for verification and calibration have begun. We present the current status of the x-ray tests at MIT, focusing on diffraction efficiency measurements and a grating tilt test. We indicate the direction the x ray testing will take in the near term.

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