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Scientific paper
Dec 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.5209..182a&link_type=abstract
Materials for Infrared Detectors III. Edited by Longshore, Randolph E.; Sivananthan, Sivalingam. Proceedings of the SPIE, Volum
Other
Scientific paper
In a smart weapon system, reliability of the sensor system is the most essential characteristic. Self Test (ST) is a way to diagnose the health of the system in order to keep the system reliable. It is important to measure reliability not only right before system deployment but also during the system development. For a robust self test design, many things need to be addressed. One important consideration is a way to input threshold values without code change to the released self test. Threshold values can be ever changing measuring sticks depending on each sensor"s characteristics or material changes during the development of sensors. Another consideration is a way to do fault isolation to enable component replacement. In this paper, we will present how we have built a robust self test for the MMS. In the conclusion, lessons learned will be shared.
An Y. K.
Howard Beth
Kubala Diane
McAdam Bill
Mills Kathy
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