Boundary Scan: Moving Test Up to Higher Integration Levels

Details Boundary Scan: Moving Test Up to Higher Integration Levels Boundary Scan: Moving Test Up to Higher Integration Levels

Jul 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997esasp.395..351s&link_type=gif

Electronic Component Conference - EECC'97, Proceedings of the 3rd ESA Electronic Component Conference held 22-25 April, 1997 at

Computer Science

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