Bias-free imaging at low light levels

Details Bias-free imaging at low light levels Bias-free imaging at low light levels

Jul 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010spie.7734e.136g&link_type=abstract

Optical and Infrared Interferometry II. Edited by Danchi, William C.; Delplancke, Françoise; Rajagopal, Jayadev K. Proceeding

Computer Science

1

Scientific paper

Measurements from long-baseline interferometry are commonly analysed in terms of the power spectrum and the bispectrum (or triple-product) of the fringe patterns, as these estimators are invariant in the presence of phase instabilities. At low light levels, photon and detector noise give rise to systematic "bias" in the power spectrum and bispectrum. This paper extends previous work on computing the expected biases and variances for these quantities by introducing a general method which can be applied to any fringe-encoding scheme where the measurement equation is linear and to measurements affected by a combination of photon noise and detector noise. We apply our method to a number of interesting practical cases, including systems with unevenly-sampled fringe patterns and in the presence of read noise.

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