Bias-Corrected Chandra Multiwavelength Project (ChaMP) X-ray Log(N)-Log(S) Relation

Details Bias-Corrected Chandra Multiwavelength Project (ChaMP) X-ray Log(N)-Log(S) Relation Bias-Corrected Chandra Multiwavelength Project (ChaMP) X-ray Log(N)-Log(S) Relation

May 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004aas...204.7501k&link_type=abstract

American Astronomical Society Meeting 204, #75.01; Bulletin of the American Astronomical Society, Vol. 36, p.805

Astronomy and Astrophysics

Astronomy

Scientific paper

We present X-ray Log(N)-Log(S) relations which are corrected the incompleteness and Eddington bias and which are deeper by a factor of a few than the first ChaMP results in Kim et al. (2004). To quantitatively characterize the sensitivity and completeness as a function of source flux, off-axis distance and background level, we have performed a large set of simulations. We have simulated ˜ 13,000 artificial X-ray sources per deg2, added them to each Chandra observation in the ChaMP sample and run the same procedures of detection and source extraction as in the ChaMP data processing. We compare our ChaMP results with those of Chandra deep fields and search for the statistically significant field-to-field variation of the cosmic background source density.
This work is supported in part by NASA grant AR4-5017X (Chandra).

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