Beam emittance measurements using optical diffraction-transition radiation interferometry

Details Beam emittance measurements using optical diffraction-transition radiation interferometry Beam emittance measurements using optical diffraction-transition radiation interferometry

Apr 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002aps..aprk16007f&link_type=abstract

American Physical Society, April Meeting, Jointly Sponsored with the High Energy Astrophysics Division (HEAD) of the American As

Astronomy and Astrophysics

Astrophysics

Scientific paper

Optical diffraction-transition radiation interferometry is a novel diagnostic technique, which is being developed by us to measure the rms divergence and emittance of low emittance electron beams. This technique overcomes the fundamental limitation of conventional optical transition radiation interferometry diagnostics, i.e. foil scattering, by employing a perforated screen for the first foil in the interferometer. With the proper choice of hole sizes, screen thickness, screen material density, interfoil spacing, observation wavelength and optical band pass, interferences due to ODR-OTR from unscattered electrons passing through the screen holes can be made visible and used for diagnosing the rms beam divergence. Simultaneous measurements of the beam size and divergence produces an rms emittance measurement. We have performed a proof of principle experiment for this new device at the Advanced Test Accelerator Facility at Brookhaven National Laboratory using a 40 MeV electron beam. A comparison of simulation code and experimental results will be presented.

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