Balmer alpha line shape and surface morphology during depth profiling analysis of thin film

Details Balmer alpha line shape and surface morphology during depth profiling analysis of thin film Balmer alpha line shape and surface morphology during depth profiling analysis of thin film

Jul 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008pobeo..84..265s&link_type=abstract

Publications of the Astronomical Observatory of Belgrade, vol. 84. pp. 265-268

Astronomy and Astrophysics

Astronomy

Scientific paper

The results of the H_alpha line shape analysis during depth profiling of zinc thin layer at steel surface (commercial name of materials: galfan and galvanneal) are presented. Changes of the H_alpha line shape are detected during depth profiling of thin layer in Grimm discharge. An attempt is made to correlate the H_alpha line shape changes with surface morphology recorded with Atomic Force Microscope (AFM).

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