Aspects of silicate surface and bulk structure analysis using X-ray photoelectron spectroscopy (XPS)

Details Aspects of silicate surface and bulk structure analysis using X-ray photoelectron spectroscopy (XPS) Aspects of silicate surface and bulk structure analysis using X-ray photoelectron spectroscopy (XPS)

Jun 1988

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1988gecoa..52.1641h&link_type=abstract

Geochimica et Cosmochimica Acta, vol. 52, Issue 6, pp.1641-1648

Computer Science

5

Scientific paper

X-ray photoelectron spectroscopy (XPS) has been used to study the average local environment and polarizability of oxygen in the near-surface region of crystalline and amorphous SiO 2 , NaAlSi 3 O 8 , NaAlSi 2 O 6 , NaAlSiO 4 , and CaMgSi 2 O 6 , as well as crystalline Mg2SiO 4 and rhyolitic and basaltic composition glasses. For these materials, the O Is chemical shift due to different oxygen environments is not as large as in previously studied alkali silicate and alkali aluminosilicate systems. However, it was found that the O Is peak width (measured as FWHM) for the minerals is proportional to the number of chemically distinct oxygen environments in each structure. Further, O Is FWHM values for the mineral and rock composition glasses suggest certain structural details that correlate well with previously proposed amorphous structure models. Taken together, these results suggest that the shape and width of the O Is line may be important in monitoring atomic-level structural changes that may occur on silicate mineral and glass surfaces during, for example, reactions with aqueous solutions. In addition, for the O is line to be useful for bulk structural information, approximately the upper 60A of the sample must be representative of the bulk. The O 2s photopeak and X-ray induced O KL 2,3 L 2,3 Auger line were also carefully studied, although they did not yield further structural information beyond that provided by the 0 Is line. However, the oxygen Auger parameters derived using the energy difference between the O Is and O KL 2,3 L 2,3 lines for the crystals and glasses in this study within the Na 2 O-Al 2 O 3 -SiO 2 system show a systematic trend with bulk composition. This trend reflects a change in the polarization energy (extra-atomic relaxation energy) for oxygen in these materials.

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