Statistics – Applications
Scientific paper
May 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003head....7.2233d&link_type=abstract
American Astronomical Society, HEAD meeting #7, #22.33; Bulletin of the American Astronomical Society, Vol. 35, p.865
Statistics
Applications
Scientific paper
NIST has been developing arrays of Transition Edge Sensor (TES) detectors for use in high resolution x-ray spectroscopy applications. These arrays are designed for use both in imaging spectroscopy at the focal plane of an x-ray telescope (e.g., Constellation X), and to rapidly collect spectra for materials analysis applications. In order to build a complete detector system, several areas of technology development have been pursued. Surface micromachining and deep reactive ion etching have been incorporated into detector array fabrication processes, and new materials are being investigated to produce the superconducting films used in TES detectors. SQUID multiplexing has been developed and tested with eight x-ray TES detectors.
Beall James
Beyer Joschka
Deiker Steve
Dorwart R.
Hilton Gene
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