Application of relative sensitivity factors for investigation of processes in pulsed glow discharge plasma with TOFMS ion detection

Astronomy and Astrophysics – Astronomy

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Scientific paper

Relative sensitivity factors (RSF's) for different matrices (copper, steel, nickel, lead, silicon) in pulse-GD MS are determined. The possibilities of time-of-flight mass spectrometry with pulse glow discharge ionization in semi-quantitative analysis without using of standards samples are discussed. Dispersal of RSF's is appreciably low in comparison with RSF dispersal for DC discharge. Different types of correlation between RSF of the element and its ionization potential were obtained. According to this fact assumptions about different plasma processes in glow discharges were made.

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