Other
Scientific paper
Sep 1995
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995metic..30r.590v&link_type=abstract
Meteoritics, vol. 30, no. 5, page 590
Other
Chondrules, Clasts, Ion (Proton) Microprobe, Meteorites, Allende, Composition Of
Scientific paper
A scanning ion microprobe has been developed and utilized to study elemental concentration correlations on surfaces. Proton beams produced by the Naval Academy's 1.7 MV tandem electrostatic accelerator are focussed onto the sample with a beam spot diameter of ~30 micrometers. The sample is mounted on a 5-axis computer-controlled goniometer which moves the sample around in the beam. Elemental concentrations are determined with the Proton-Induced X-Ray technique (PIXE). Scans have been made on a variety of inclusions in the Allende meteorite in situ. Scans typically cover 20 x 20 grids with a stepsize of 25-100 micrometers. These scans require approximately 5 hours of beamtime. Concentrations of elements were extracted from the X- Ray spectra with the automated fitting routine GUPIX [1]. There is a great deal of information buried in these 2-dimensional scans. We have employed two methods to visualize and quantify the concentration information. One method is to generate an "X-ray" image of the scan region for individual elementals. Another technique is to examine the correlation between any two elements by plotting the concentrations against each other on a graph. The distribution of points readily indicates whether the two chosen elements are directly, inversely, or randomly correlated. Numerical techniques may be applied to these correlation plots to quantify the variation in concentration as a function of position in the sample. This information is perhaps most useful near chondrule boundaries where these concentration maps may reveal the extent of elemental transport and mixing. References: [1] Maxwell J.A. (1993) Code GUPIX93, University of Guelph, Ontario.
Correll F. D.
Meehan B. T.
Moore David M.
Vanhoy J. R.
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