Apparatus for radiation effects testing on thin film interference filters at cryogenic temperatures

Details Apparatus for radiation effects testing on thin film interference filters at cryogenic temperatures Apparatus for radiation effects testing on thin film interference filters at cryogenic temperatures

Jul 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992spie.1686...61s&link_type=abstract

Proc. SPIE Vol. 1686, p. 61-64, Test and Evaluation of Infrared Detectors and Arrays II, Forney M. Hoke; Ed.

Computer Science

Scientific paper

For many years personnel of NRaD, formerly NOSC, have been
characterizing infrared focal plane filters and components at cryogenic
temperatures. We have recently begun investigating the effects of
ionizing radiation on these items.

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