Analytical Applications Of Particle-Induced X-Ray Emission (PIXE)

Details Analytical Applications Of Particle-Induced X-Ray Emission (PIXE) Analytical Applications Of Particle-Induced X-Ray Emission (PIXE)

Apr 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007aipc..899..538p&link_type=abstract

SIXTH INTERNATIONAL CONFERENCE OF THE BALKAN PHYSICAL UNION. AIP Conference Proceedings, Volume 899, pp. 538-538 (2007).

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X-Ray, Mossbauer, And Other Gamma-Ray Spectroscopic Analysis Methods, X- And Gamma-Ray Spectroscopy

Scientific paper

In this paper a complex study of the capabilities of Particle-Induced X-ray Emission (PIXE) technique for the determination of major, minor and trace constituents of metallurgical, biological and environmental samples has been done. The elements identified in the metallurgical samples (steels) using PIXE were: K, Ca, V, Cr, Mn, Fe, Co, Cu, Ni, Zn, W, Ga, As, Pb, Mo, Rb, In, Rh, Zr, Pd, Nb, Sn and Sb. In the investigated biological and environmental samples (vegetals leaves, soil and mosses) PIXE analysis allowed determination of: S, Cl, K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, As, Hg and Pb.

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