Analysis of Organic Compounds from Stardust Samples Using C60-ToF-SIMS

Details Analysis of Organic Compounds from Stardust Samples Using C60-ToF-SIMS Analysis of Organic Compounds from Stardust Samples Using C60-ToF-SIMS

Mar 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008lpi....39.2110r&link_type=abstract

39th Lunar and Planetary Science Conference, (Lunar and Planetary Science XXXIX), held March 10-14, 2008 in League City, Texas.

Computer Science

Scientific paper

Surfaces of flight aerogel exposed to the cometary particle flux as well
as unexposed have been analyzed with latest technology ToF-SIMS,
utilising a beam of 40kV C60 ions, most suitable to measure
heavy organic compounds at high lateral resolution.

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