Analysis of Optical Constants, Single-Scattering Albedo and Absorption Efficiency of Quartz and Applications for Planetary Remote Sensing

Mathematics – Logic

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Analysis of the optical constants, single-scattering albedo and absorption efficiency provides information about the spectral character of minerals that is important for interpretation of reflectance and emittance spectra. The mid-infrared spectral properties of minerals include information about particle size and sample texture in addition to composition. Alpha-quartz samples were used in these experiments because the spectral properties are well known. The optical constants of quartz have been determined from ellipsometry [1] and compared to the optical constants produced by Spitzer and Kleinman [2] using dispersion analysis and reflectance spectra and those determined by Wenrich and Christiansen [3] from emittance spectra. Mie theory was used to calculate the efficiencies of a spherical particle as a function of the optical constants and the size parameters. Spectral analysis of quartz with respect to the optical constants has shown that for certain wavelengths the reflectance and emittance spectra are especially sensitive to particle size. Following work by Conel [4] we have defined four physically logical cases where the spectra are expected to exhibit interesting behavior: (i) n = 1, k small, (ii) n < 1, k small, (iii) n undergoes rapid change, k large and (iiii) n < 1, k small. Our spectral analysis of multiple particulate quartz samples shows that reflectance and emittance spectra are particulary sensitive to particle size in these regions and that a different kind of spectral behavior with respect to particle size is observed for each case. This study indicates that analysis of the optical constants provides information about the textural components of mid-infrared spectra important for interpretation of reflectance and emittance spectra of planetary surfaces. References: [1] Arnold et al., 1996, LPSC, XXVII, 39-40; Humlicek and Roeseler, 1993, Thin Solid Films, 234, 332-336; [2] Spitzer and Kleinman, 1961, Physical Review, 121, 1324-1335, [3] Wenrich and Christiansen, J.G.R., 1996, in press [4] Conel, 1969, J.G.R., 74, 1614-1634.

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