Computer Science – Performance
Scientific paper
Dec 2002
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507..239h&link_type=abstract
Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H
Computer Science
Performance
1
Scientific paper
Historically, memory components have been used as technology drivers in the semiconductor industry. Consequently memory components have been and remain the most dynamic product segment in the area of digital integrated circuits. An abundance of different memory types exists and product life cycles tend to be short, in some instances with up to 2 die revisions per year. For space applications this presents a particular challenge in the area of radiation testing. Device complexity, performance, the diversity of architectures and the use of innovative micro-packaging concepts, pose many practical problems in the implementation of Single Event Effects (SEE) testing and analysis of test results. This paper aims to provide an overview of the current situation and describes the evolution of test approaches used or proposed for heavy ion SEE testing of advanced memory components.
No associations
LandOfFree
An overview of radiation single event effects testing of advanced memory components does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with An overview of radiation single event effects testing of advanced memory components, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and An overview of radiation single event effects testing of advanced memory components will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-964307