An analytic Voigt profile escape probability approximation

Details An analytic Voigt profile escape probability approximation An analytic Voigt profile escape probability approximation

Nov 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985jqsrt..34..447a&link_type=abstract

Journal of Quantitative Spectroscopy and Radiative Transfer (ISSN 0022-4073), vol. 34, Nov. 1985, p. 447-452. DARPA-supported re

Mathematics

Probability

48

Laser Plasmas, Light Transmission, Optical Thickness, Radiative Transfer, Voigt Effect, Astrophysics, Escape, Probability Theory, Ray Tracing

Scientific paper

An efficient analytic Voigt profile escape probability approximation is presented and compared to exact numerical calculations. Using this analytic approximation, the two-level-atom source function is also computed for optically thick media, which have been previously evaluated exactly by Avrett and Hummer. Comparison with a more realistic laboratory plasma case also validates the usefulness of the approximation for economical modeling of radiation transport in optically thick plasmas.

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