An Analysis of Presolar SiC X Grains and Mainstream Grains Using Transmission Electron Microscopy

Details An Analysis of Presolar SiC X Grains and Mainstream Grains Using Transmission Electron Microscopy An Analysis of Presolar SiC X Grains and Mainstream Grains Using Transmission Electron Microscopy

Mar 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009lpi....40.1398h&link_type=abstract

40th Lunar and Planetary Science Conference, (Lunar and Planetary Science XL), held March 23-27, 2009 in The Woodlands, Texas, i

Computer Science

2

Scientific paper

We report the results of a coordinated NanoSIMS and TEM study of seven
SiC X grains and two mainstream grains from the same size fraction in
order to compare the isotopic and microstructural results of formation
in two very different stellar environments.

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