Abrasive sampling for diffuse reflectance using reflective substrates

Details Abrasive sampling for diffuse reflectance using reflective substrates Abrasive sampling for diffuse reflectance using reflective substrates

Jun 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998aipc..430..506h&link_type=abstract

The eleventh international conference on fourier transform spectroscopy. AIP Conference Proceedings, Volume 430, pp. 506-508 (1

Computer Science

Organic Compounds, Polymers, Infrared Spectrometers, Auxiliary Equipment, And Techniques

Scientific paper

The measurement of diffuse reflection spectra from samples collected on an abrasive substrate is reviewed. Abrasives of 400 grit or finer are recommended for mid-IR spectra. Using a reflective metal-coated substrate is shown to improve the signal-to-noise ratio by up to a factor of five. An extremely robust diamond-in-metal sampling device can be used to obtain excellent spectra from very hard materials such as quartz.

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