A statistical model of reflections from the sporadic-E layer

Details A statistical model of reflections from the sporadic-E layer A statistical model of reflections from the sporadic-E layer

Oct 1984

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1984ge%26ae..24..727t&link_type=abstract

Geomagnetizm i Aeronomiia (ISSN 0016-7940), vol. 24, Sept.-Oct. 1984, p. 727-732. In Russian.

Computer Science

Sound

1

Atmospheric Models, Ionospheric Propagation, Radio Echoes, Sporadic E Layer, Wave Reflection, Ionospheric Sounding, Random Processes, Statistical Analysis, Vertical Motion, Weibull Density Functions

Scientific paper

A statistical reflection model is proposed which is based on the representation of variations of the critical frequency and the screening frequency as random processes. The model describes the pattern of variations of the main parameters of reflection from the sporadic-E layer during vertical sounding and the functional relationship between these parameters. The validity of the model is confirmed by data from ionospheric stations.

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